Capacitive Sensing

Applications of these sensors cover two sided sensor gap measurement, dimensional measurement, thickness measurement, vibration measurement, position and displacement, position control, alignment, inner and outer diameter measurement, eccentricity and concentricity measurement.

• Thin Gaps - Reliable and repeatable non-contact methods to measure thin gap between 0.010” and 0.125”.
• High Temperature - Displacement sensors that can handle extremely high temperature up to 1000°C.
• Extreme Environment - Displacement sensors for harsh environments maintaining the perfect alignment of a particle detector in a gap measuring only 0.05”, at 150°C and in a chamber that exposed to 2 tesla magnetic field along with 107 RADS of radiation.
• Non Intrusive Alignment - Micro-inch level positioning sensing systems assist chip processing and handling equipment manufacturers to sense silicon wafers for exact positioning prior to deposition, etching and other processes.

Applicable for aerospace, automotive, polymer, glass, printing industries.

Autocorrelators

These autocorrelators are used for measurements of ultrashort (ps, fs) pulses, with femto-second resolution (APE: 50fs standard, 20fs optional, or Femtolasers: 5fs - 300fs), spectral range 550nm - 1100nm (other wavelengths on request), based on Michelson interferometer.

UF Pulse Measurements

Using a biprism as a miniaturized optical delay line, a thick SHG crystal for extracting spectral information from single pulses and combining the two into one compact unit, leads to a simple way of measuring several parameters at the same time. In combination with VideoFROG software and UPM GRENOUILLE oscilloscope for ultrashort laser pulses, the time domain and frequency domain intensity and phase can be displayed and interpreted very easily.

We provide a family of micro-optics and wavefront sensor based instrumentation for lasers, optics, ophthalmology and semiconductor metrology.

Low & High Order Aberrometers

•  COAS Precision Aberrometers

The complete ophthalmic analysis systems come with high accuracy and resolution for a complete analysis of the refractive path of the eye. Real time measurements provide the ability to analyze aberrations in many different forms including pupil size, Zernike polynomials, modulation transfer function (MTF), point spread function (PSF) and others.

•  ClearWave Contact Lens Precision Aberrometers

Designed for the development and production of contact lenses, these aberrometers include an extremely high dynamic range and resolution Shack-Hartmann wavefront sensor to profile contact lenses accurately. Besides sphero-cylinder, they are also able to measure higher order aberrations. The aberrometers are specially suited for locating defects and controlling the quality of modalities for making customized contact lenses.

•  CrystalWave Intra-ocular Lens Precision Aberrometers

These aberrometers are designed to measure intra-ocular lenses for spherical power, cylinder, axis, coma, trefoil and other high order aberrations.

CLAS 2D Instant Phase Analysis

Divergent light sources (laser diodes) and complicated optical setups or optical components can be analyzed in terms of intensity and phase distribution without expensive test plates or null correctors. The principle is based on a micro-optic lenslet array and high speed CCD camera. It provides many parameters like M2, MTF, RMS wavefront, Strehl ratio, Seidel and Zernike aberration coefficients.

Columbus Wafer Nanotopography Measurement Systems

These systems address wafer metrology needs for advanced IC manufacture. They provide high precision wafer geometry measurements for standard and advanced unpatterned wafers including shape, flatness, nanotopography and edge roll off.

Integrated Systems

•  OmniWave Aspheric Surface Measurement

OmniWave introduces stitching metrology by piecing together measurements of the extended aspheric surface with filtering. This ensures that all portions of the measurement are valid before final figuring and greatly reduce the number of fabrication steps. These systems can measure extremely high aspect ratio parts (f#<0.8) and aspheric components up to 1000.

•  RadiiWave Precision Radiimeters

The precision radiimeters are fully automated compound video microscope-based systems. Performing at high speed radii measurements on fully and partially reflective surfaces, these systems can achieve absolute accuracy of +/- 2 microns and repeatability of 1 micron or less.

•  Lens ID Finished and Semi-finished Spectacle Lenses Testing Systems

The Lens ID systems allow testing of finished and semi-finished spectacle lenses in line with production and packaging systems. The system cycle is around 4 secs or less. Various types of products can be tested with subliminal and printed fiducials.

•  PowerWave Automated Lens Testers

Fully compliant with ISO 11979, these lens testers provide testing for EFL and resolution of ophthalmic lenses. They are specially designed for continuous duty cycles, ensuring minimum maintenance.

The Dual PEM Stokes Polarimeter is a state of the art metrology device for measuring the polarization state of light.  Each of our polarimeters can quantify all 4 Normalized Stokes vectors with a single measurement and no moving parts. The Stokes Polarimeter is currently available in the following models; UV – Visible, NIR, Mid IR, NIR Fber Polarimeter and UV to IR.

We provide a comprehensive range of polarization modulators and detectors for various applications.

Optical Head Assemblies

The PEM-90 Series I modulators is designed and built to vibrate at a resonant frequency that is determined by its size. Different optical materials are used to cover the operating range from vacuum UV to near IR.

The PEM-90 Series II modulators use a symmetric or octagonal shape for the modulator optical element. A two-dimensional standing wave in the optical element doubles the retardation available for a given drive voltage. Series II modulators are particularly useful in the infrared spectrum.

DUAL PEM Systems

These systems allow real-time polarization analysis measurements. When only one PEM is used, two measurements must be made with the sample rotated 45° after the first measurement. However, measurements can be made in real time using two PEMs mounted at 45° with respect to each other.

Photo Detectors

The silicon and germanium photodiode and avalanche photodiode detectors are designed to meet the specific requirements for maximum flexibility of operation.

• Frequency response. DC to several times the operating frequency of the PEM being used. 
• Dark-current and/or background DC null.
• Preamplification for current to voltage conversion and buffering for impedance matching to signal cables. 
  
  
  

PEM-100 Controller

The PEM-100 controller controls the peak retardation of the photoelastic modulator optical head. It provides a DC voltage signal to the electronic head which determines the transducer vibration amplitude and thus the strain amplitude in the optical element. A current feedback loop from the electronic head enables the controller to maintain stable peak retardation levels.

Signal Conditioning Unit

The SCU is used to measure both the AC and DC signals. It separates both signals and applies selectable amplification.

Exicor Birefringence Measurement Systems

Utilizing the patented Photoelastic Modulator (PEM) technology, these systems provide the advanced birefringence sensitivity for high speed sub-nanometer measurements.

An optical sample as large as 12" X 12" can be characterized manually or automatically mapped and graphically displayed. Once a sample is placed on the translation stage, intuitive software guides the operator through the step measurement process. User interface software calculates the retardation value and angle and displays them in a variety of formats. The software also provides file management, calibration and statistical analysis features.

Spectroradiometers

With the patented Pritchard optics to collect incoming optical radiation, these spectroradiometers are designed for various light measurement applications, including the cathode ray tube ("CRT")/flat panel display ("FPD"), automotive, aerospace, lighting, motion picture, research and development and related industries.

Photometers & Video Photometers

Photometers are specifically designed to measure emitted, reflected or transmitted light in photometric terms of luminous flux, luminance, illuminance or luminous intensity. Our photometers come with the patented Pritchard optical system to clearly and unambiguously define the area to be measured.

The video photometers utilize a multi-element, two-dimensional detector which enables “snapshot” images of a target and allows photometric analysis thereafter. In comparison to traditional instruments, a video photometer allows several “measurements” to be performed simultaneously, creating ease of use and less time taken to complete tasks such as display uniformity. The detector spectral response of Video Photometers is filtered to match the CIE Photopic response function for accurately weighted photometric measurements.

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